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Centre for Ion Beam Applications

Department of Physics, National University of Singapore

Analytical Services to Industry

The Research Centre for Nuclear Microscopy offers analytical services for industrial clients in the areas of surface, interface and thin film characterization. The techniques utilized for analysis include:


Rutherford Backscattering Analysis (RBS)
Elastic Recoil Detection Analysis (ERDA)
Proton Induced X-ray Emission (PIXE)
Scanning Transmission Ion Microscopy (STIM)
Ion Beam Induced Charge (IBIC)
Channeling Contrast Microscopy (CCM)
Ionoluminescence (IL)



Centre for Ion Beam Applications
c/o Department of Physics
National University of Singapore
Block S12, 2 Science Drive 3,
Singapore 117542
Fax: 6777 6126
Tel: 6516 2639


Contact Persons:
Prof F.Watt (Tel: 6516-2815) phywattf@nus.edu.sg
Dr T. Osipowicz ( Tel:6516-6745) phyto@nus.edu.sg